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IBL-26-0128

Optical Microscope Using an Indicator

Listed on
2025-03-25
Indicator-Based Thermal-Distribution Optical Microscopy Technology

This technology relates to an optical microscopy technique that visualizes thermal distribution optically by using an indicator.

Conventional IR sensors are expensive and have difficulty measuring thermal distributions in microregions at high resolution. This technology configures an indicator positioned above the observation target to exhibit a thermal response, thereby enabling analysis of thermal distribution with a general optical microscope.

As a result, it enables high-resolution and high-sensitivity thermal imaging with lower cost, and can be applied to device evaluation, materials analysis, and biological observation.




Key Features:

  • It optically measures thermal response through an indicator positioned above the target of interest.
  • It performs microregion thermal-distribution imaging using a general optical microscope.
  • It enables cost-effective thermal analysis compared with high-cost IR equipment.


Sogang University
Lee Gi-Jin, Lee Han-Ju
Document
출원일:
2015-03-06
|
특허등록번호:
10-1692869
Industry
electrical devices
semiconductors
healthcare•pharm
Technology
Optics•Sensor
Image processing
Electric & Electronics
Country
Korea
Family Patent

N/A

Price
Price negotiable
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