Microwave neafield microscope based on optical indicator and nearfield heating

Microwave near-field high-resolution imaging microscopy using thermal distribution

This technology is about a microwave near-field imaging microscope. Circularly polarized light is incident on an irradiation object, the reflected light is analyzed, and the heat distribution can be optically imaged using an indicator.

As the demand for wide-area communication systems in the high-frequency band is rapidly increasing, technology for verifying and investigating microwave devices is required, but the existing technology has the disadvantage of long measurement time and difficulty in designing a probe for measurement. There was.

Through this technology, it is possible to investigate the driving method of the device and verify the reliability of the device by providing a microscope that images the microwave near-field by optically imaging the distribution of heat generated by the microwave near-field using an indicator.

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Key Features:

• Combining the 'near-field heating phenomenon', in which a microwave near-field generates heat in a specific material, and the 'photoelastic effect', in which the internal stress changes and the polarization state of light changes when the material is heated
• An indicator is made by depositing a polymer with high dielectric loss when detecting a microwave electric field and a magnetic thin film with high magnetic loss when detecting a magnetic field on a glass substrate with a good photoelastic effect
• The reflected light is split into 45 and 90 degree directions using a spectrometer, and each change in brightness is measured using a CCD camera.

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